Compact & portable
- Handheld device
- On-site measurements capability
- Ideal for laboratory, classroom or industrial uses
Fast & easy to use
- Simultaneous measurement at two angles
- Precise measurement in a few seconds
- No dispersion model needed
- Fast calibration
A tool fitted to your needs!
Accessible & adaptable
- No mechanical adjustments, even for big or thick samples
- Mastering it is a question of minutes
- Customizable on request (wavelength, board material...)
an innovative design...
Two angles, single-wavelength
With a two angles simultaneous measurements design, the IPSO 200© optimizes the analysis of the opto-geometrical properties of the sample, without the need of any material's dispersion modeling.
Two angles ellipsometer
Patented modulation technology
Our proprietary modulation technology is based on the use of a specific integrated phase modulator. An on-board 32-bits microcontroller optimizes the modulation and the signal analysis.
Complete & easy to use software
With a focus on providing a great user experience and efficiency of use, the IPSO 200© software presents complete capabilities, with the possibility of analysis of thin layers stacks with up to 8 consecutive layers of arbitrary material.
Reliable, versatile & adaptable...
With the size of a reflex camera and weighting less than 1 kg...
You can bring your ellipsometer wherever you want!
Thanks to a design where the thickness of the sample doesn't require any adjustment of the device, combined with its portabilty:
It is very easy to make measurements in non-laboratory situations...
According to the needs of our customers, specific adjustments can be proposed such as non-scratching Teflon board to protect fragile samples. Red or near-infrared stabilized laser sources are available on request.
Fitted to customer's needs
...for a wide variety of applications
Semi-conductor industry, glass industry or metallurgy all need to know the precise thickness of thin layers for process feed-back, reflective layer design or oxidation layer control.
Production line ready
IPSO 200© is yet another step in making more accessible nanotechnology manufacturing solutions, where ellipsometry is an essential technique for the characterization of thin films deposition...
Biotech & nano-tech
Ellipsometry is a key tool to master for any future professional in the field of nano-technologies or material science. It also gives access to the educational study of phenomena such as thin-film chemistry, sensors, etc.
|Dimensions||160 x 75 x 72 mm|
|Temperature of operation||5 - 35°C|
|Wavelength||670 nm (760 or 850 nm available on request)|
|Angles of incidence||55° and 70° simultaneously|
|Laser class||Class 2 (Class 1 available on request)|
|Laser output power||650 μW at 55°, 400 μW at 70°|
|Input voltage||5 V (USB)|
|Measurement precision||± 1 nm|
|Typical measurement time||2 - 5 s|
|Sample holder material||Aluminium (Teflon, PMMA or POM available on request)|